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Sequential analysis: tests and confidence intervals/ David Siegmund.

By: Series: Springer series in statisticsPublication details: New York: Springer-Verlag, c1985.Description: xi, 272 p.: ill.; 25 cmISBN:
  • 0387961348
Subject(s): DDC classification:
  • 519.2 S571s
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Item type Current library Collection Call number Copy number Status Date due Barcode
Books Books Castorina Estantes Abertas (Open Shelves) Livros (Books) 519.2 S571s 1985 IMPA (Browse shelf(Opens below)) 1 Available 39063000118656

Includes index.

Bibliography: p. [263]-270.

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