Sequential analysis: tests and confidence intervals/ David Siegmund.
Series: Springer series in statisticsPublication details: New York: Springer-Verlag, c1985.Description: xi, 272 p.: ill.; 25 cmISBN:- 0387961348
- 519.2 S571s
Item type | Current library | Collection | Call number | Copy number | Status | Date due | Barcode |
---|---|---|---|---|---|---|---|
Books | Castorina Estantes Abertas (Open Shelves) | Livros (Books) | 519.2 S571s 1985 IMPA (Browse shelf(Opens below)) | 1 | Available | 39063000118656 |
Includes index.
Bibliography: p. [263]-270.
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