Results
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801.
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Single event effects in aerospace / Edward Petersen. by
- Petersen, Edward, 1932-
- IEEE Xplore (Online Service) [distributor.]
- John Wiley & Sons [publisher.]
Material type: Text; Format:
available online
Publisher: Piscataway, New Jersey : IEEE Press, c2011Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2012]
Availability: No items available.
Found in Open Library:
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802.
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Computational methods for electromagnetics / Andrew F. Peterson, Scott L. Ray, Raj Mittra. by
- Peterson, Andrew F, 1960-
- Mittra, Raj
- Ray, Scott L, 1957-
- John Wiley & Sons [publisher.]
- IEEE Antennas and Propagation Society
- IEEE Xplore (Online service) [distributor.]
Series: IEEE/OUP series on electromagnetic wave theory ; 4
Material type: Text; Format:
available online
Publisher: New York : IEEE Press, c1998Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [1997]
Availability: No items available.
Found in Open Library:
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803.
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Photovoltaic sources modeling / Giovanni Petrone, University of Salerno, Italy, Carlos Andr�aes Ramos-Paja, Universidad Nacional de Colombia, Giovanni Spagnuolo, University of Salerno, Italy. by
- Petrone, Giovanni [author.]
- Ramos-Paja, Carlos Andr�aes [author.]
- Spagnuolo, Giovanni [author.]
- IEEE Xplore (Online Service) [distributor.]
- Wiley [publisher.]
Series: Wiley - IEEE
Material type: Text; Format:
available online
Publisher: Chichester, West Sussex, United Kingdom : John Wiley & Sons, Inc., [2017]Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2017]
Availability: No items available.
Found in Open Library:
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804.
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805.
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806.
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807.
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System identification : a frequency domain approach / Rik Pintelon, Johan Schoukens. by
- Pintelon, R., (Rik) [author.]
- Schoukens, J. (Johan)
- IEEE Xplore (Online Service) [distributor.]
- Wiley InterScience (Online service) [publisher.]
Edition: 2nd ed.
Material type: Text; Format:
available online
Publisher: Hoboken, N.J. : Piscataway, NJ : Wiley ; IEEE Press, Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2012]
Availability: No items available.
Found in Open Library:
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808.
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809.
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810.
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Modeling for reliability analysis : Markov modeling for reliability, maintainability, safety, and supportability analyses of complex computer systems / Jan Pukite, Paul Pukite. by
- Pukite, Jan, 1928-
- Pukite, Paul
- John Wiley & Sons [publisher.]
- IEEE Xplore (Online service) [distributor.]
Series: IEEE Press series on engineering of complex computer systems ; 2
Material type: Text; Format:
available online
; Literary form:
Not fiction
Publisher: New York : IEEE Press, c1998Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [1998]
Availability: No items available.
Found in Open Library:
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811.
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812.
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813.
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814.
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Renewable energy and climate change / Volker Quaschning. by
- Quaschning, Volker, 1969-
- IEEE Xplore (Online Service) [distributor.]
- John Wiley & Sons [publisher.]
- ebrary, Inc
Series: Wiley - IEEE
Material type: Text; Format:
available online
Publisher: Chichester, West Sussex, U.K. : Wiley, c2010Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2011]
Availability: No items available.
Found in Open Library:
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815.
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Fundamentals of IoT and wearable technology design / Haider Raad. by
- Raad, Haider Khaleel [author.]
- IEEE Xplore (Online Service) [distributor.]
- Wiley [publisher.]
Edition: First edition.
Material type: Text; Format:
available online
Publisher: Hoboken, New Jersey : John Wiley & Sons, Inc., [2021]Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2020]
Availability: No items available.
Found in Open Library:
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816.
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Modeling and design techniques for RF power amplifiers / Arvind Raghavan, Nuttapong Srirattana, Joy Laskar. by
- Raghavan, Arvind [author.]
- Laskar, Joy
- Srirattana, Nuttapong
- IEEE Xplore (Online Service) [distributor.]
- John Wiley & Sons [publisher.]
- ebrary, Inc
Material type: Text; Format:
available online
; Literary form:
Not fiction
Publisher: Hoboken, New Jersey : Wiley-Interscience, c2008Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2007]
Availability: No items available.
Found in Open Library:
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817.
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818.
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819.
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820.
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