Siegmund, David,  1941- <br/><br/>
Sequential analysis:  tests and confidence intervals/ 
David Siegmund. 
 - New York:  Springer-Verlag,  c1985. 
 - xi, 272 p.:  ill.;  25 cm. 
 - Springer series in statistics. .
<br/><br/> Includes index. 
<br/><br/>Bibliography: p. [263]-270. 
<br/><br/><label>ISBN: </label>0387961348 
<br/><br/><label>LCCN: </label>85007942 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Sequential analysis<br/>Statistical hypothesis testing<br/>Confidence intervals.
<br/><br/><label>Dewey Class. No.: </label>519.2  / S571s