Applied logistic regression/ David W. Hosmer, Jr., Stanley Lemeshow.

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Series: Wiley series in probability and mathematical statistics. Applied probability and statisticsPublication details: New York: Wiley, c1989.Description: xiii, 307 p. ; 24 cmISBN:

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Holdings
Item type	Current library	Collection	Call number	Copy number	Status	Date due	Barcode
Books	Castorina Estantes Abertas (Open Shelves)	Livros (Books)	519.5 H827a 1989 IMPA (Browse shelf(Opens below))	1	Available		39063000113764

"A Wiley-Interscience publication."

Includes bibliographical references (p. 291-300) and index.

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