Statistical analysis of measurement errors/ John L. Jaech.

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Publication details: New York: Wiley, c1985.Description: xxiii, 293 p. ; 24 cmISBN:

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Holdings
Item type	Current library	Collection	Call number	Copy number	Status	Date due	Barcode
Books	Castorina Estantes Abertas (Open Shelves)	Livros (Books)	519.5 J22s 1985 IMPA (Browse shelf(Opens below))	1	Available		39063000114069

"An Exxon monograph."

Includes index.

Bibliography: p. 263-264.

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