Attribute sampling plans, tables of tests, and confidence limits for proportions/ Robert E. Odeh, D.B. Owen.

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Series: Statistics, textbooks and monographs ; v. 49.Publication details: New York: M. Dekker, c1983.Description: xi, 368 p. ; 26 cmISBN:

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Holdings
Item type	Current library	Collection	Call number	Copy number	Status	Date due	Barcode
Books	Castorina Estantes Abertas (Open Shelves)	Livros (Books)	519.520 O23a 1983 IMPA (Browse shelf(Opens below))	1	Available		39063000116775

Includes indexes.

Bibliography: p. 365.

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