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Markov random field modeling in image analysis/ Stan Z. Li.

By: Series: Advances in pattern recognitionPublication details: London: Springer, c2009.Edition: 3rd edDescription: xxiii, 357 p.: ill.; 24 cmISBN:
  • 9781848002784 (hbk.)
  • 1848002785 (hbk.)
  • 9781848002791
  • 1848002793
Subject(s): DDC classification:
  • 006.6 L693m
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Holdings
Item type Current library Collection Call number Copy number Status Date due Barcode
Books Books Castorina Estantes Abertas (Open Shelves) Livros (Books) 006.6 L693m 2009 IMPA (Browse shelf(Opens below)) 1 Available 39063000660087

Includes bibliographical references (p. 315-350) and index.

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