Markov random field modeling in image analysis/ Stan Z. Li.

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Series: Advances in pattern recognitionPublication details: London: Springer, c2009.Edition: 3rd edDescription: xxiii, 357 p.: ill.; 24 cmISBN:

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Holdings
Item type	Current library	Collection	Call number	Copy number	Status	Date due	Barcode
Books	Castorina Estantes Abertas (Open Shelves)	Livros (Books)	006.6 L693m 2009 IMPA (Browse shelf(Opens below))	1	Available		39063000660087

Includes bibliographical references (p. 315-350) and index.

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