Markov random field modeling in image analysis/ Stan Z. Li.
Series: Advances in pattern recognitionPublication details: London: Springer, c2009.Edition: 3rd edDescription: xxiii, 357 p.: ill.; 24 cmISBN:- 9781848002784 (hbk.)
- 1848002785 (hbk.)
- 9781848002791
- 1848002793
- 006.6 L693m
Item type | Current library | Collection | Call number | Copy number | Status | Date due | Barcode |
---|---|---|---|---|---|---|---|
Books | Castorina Estantes Abertas (Open Shelves) | Livros (Books) | 006.6 L693m 2009 IMPA (Browse shelf(Opens below)) | 1 | Available | 39063000660087 |
Includes bibliographical references (p. 315-350) and index.
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