Phénomènes critiques, systèmes aléatoires, théories de jauge: Critical phenoniena, random systems, gauge theories/ édité par Konrad Osterwalder et Raymond Stora.
Language: English Summary language: French Publication details: Amsterdam: Oxford: North-Holland, 1986.Description: 2 v. (xxxvii, 1199 p.): ill., ports.; 23 cmISBN:- 0444869808 :
- 0444870067 (Pt.1) :
- 0444870075 (Pt.2) :
- 530.1 P541
Item type | Current library | Collection | Call number | Vol info | Copy number | Status | Date due | Barcode |
---|---|---|---|---|---|---|---|---|
Books | Castorina Estantes Abertas (Open Shelves) | Livros (Books) | 530.1 P541 1986 IMPA (Browse shelf(Opens below)) | 1 | 1 | Available | 39063000148422 | |
Books | Castorina Estantes Abertas (Open Shelves) | Livros (Books) | 530.1 P541 1986 IMPA (Browse shelf(Opens below)) | 2 | 1 | Available | 39063000148430 |
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Includes French preface.
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