Modeling for reliability analysis : (Record no. 40096)
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000 -LEADER | |
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fixed length control field | 06180nam a2201297 i 4500 |
001 - CONTROL NUMBER | |
control field | 5263338 |
003 - CONTROL NUMBER IDENTIFIER | |
control field | IEEE |
005 - DATE AND TIME OF LATEST TRANSACTION | |
control field | 20230927112345.0 |
006 - FIXED-LENGTH DATA ELEMENTS--ADDITIONAL MATERIAL CHARACTERISTICS | |
fixed length control field | m o d |
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION | |
fixed length control field | cr |n||||||||| |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
fixed length control field | 100317t20151998nyua ob 001 0 eng d |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
International Standard Book Number | 9780470545317 |
Qualifying information | electronic |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
Canceled/invalid ISBN | 9780780334823 |
Qualifying information | |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
Canceled/invalid ISBN | 0470545313 |
Qualifying information | electronic |
024 7# - OTHER STANDARD IDENTIFIER | |
Standard number or code | 10.1109/9780470545317 |
Source of number or code | doi |
035 ## - SYSTEM CONTROL NUMBER | |
System control number | (CaBNVSL)mat05263338 |
035 ## - SYSTEM CONTROL NUMBER | |
System control number | (IDAMS)0b000064810c353f |
040 ## - CATALOGING SOURCE | |
Original cataloging agency | CaBNVSL |
Language of cataloging | eng |
Description conventions | rda |
Transcribing agency | CaBNVSL |
Modifying agency | CaBNVSL |
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER | |
Classification number | 004.2/1/01176 |
100 1# - MAIN ENTRY--PERSONAL NAME | |
Personal name | Pukite, Jan, |
Dates associated with a name | 1928- |
245 10 - TITLE STATEMENT | |
Title | Modeling for reliability analysis : |
Remainder of title | Markov modeling for reliability, maintainability, safety, and supportability analyses of complex computer systems / |
Statement of responsibility, etc. | Jan Pukite, Paul Pukite. |
264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE | |
Place of production, publication, distribution, manufacture | New York : |
Name of producer, publisher, distributor, manufacturer | IEEE Press, |
Date of production, publication, distribution, manufacture, or copyright notice | c1998. |
264 #2 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE | |
Place of production, publication, distribution, manufacture | [Piscataqay, New Jersey] : |
Name of producer, publisher, distributor, manufacturer | IEEE Xplore, |
Date of production, publication, distribution, manufacture, or copyright notice | [1998] |
300 ## - PHYSICAL DESCRIPTION | |
Extent | 1 PDF (xix, 258 pages) : |
Other physical details | illustrations. |
336 ## - CONTENT TYPE | |
Content type term | text |
Source | rdacontent |
337 ## - MEDIA TYPE | |
Media type term | electronic |
Source | isbdmedia |
338 ## - CARRIER TYPE | |
Carrier type term | online resource |
Source | rdacarrier |
490 1# - SERIES STATEMENT | |
Series statement | IEEE Press series on engineering of complex computer systems ; |
Volume/sequential designation | 2 |
504 ## - BIBLIOGRAPHY, ETC. NOTE | |
Bibliography, etc. note | Includes bibliographical references (p. 245-248) and index. |
505 0# - FORMATTED CONTENTS NOTE | |
Formatted contents note | Series Introduction. Preface. Introduction. System Requirements and Design. Foundations of Probability Theory. Basic Reliability Concepts. Basic Reliability Models. Markov Process Fundamentals. Hardware Reliability Modeling. Software Reliability Modeling. Combined Hardware-Software Reliability Modeling. Modeling of Large and Complex Systems. Maintainability Modeling. Availability Modeling. Safety Modeling. Markov Model Evaluation. Effectiveness Modeling. Support Analyses. Application Examples. Practical Design of Fault-Tolerant Systems. CARMS User's Guide. CARMS Model Library. CARMS Reference. Definitions and Acronyms. References. Index. About the Authors. |
506 1# - RESTRICTIONS ON ACCESS NOTE | |
Terms governing access | Restricted to subscribers or individual electronic text purchasers. |
520 ## - SUMMARY, ETC. | |
Summary, etc. | "Markov modeling has long been accepted as a fundamental and powerful technique for the fault tolerance analysis of mission-critical applications. However, the elaborate computations required have often made Markov modeling too time-consuming to be of practical use on these complex systems. With this hands-on tool, designers can use the Markov modeling technique to analyze safety, reliability, maintainability, and cost-effectiveness factors in the full range of complex systems in use today. Featuring ground-breaking simulation software and a comprehensive reference manual, MARKOV MODELING FOR RELIABILITY ANALYSIS helps system designers surmount the mathematical computations that have previously prevented effective reliability analysis. The text and software compose a valuable self-study tool that is complete with detailed explanations, examples, and a library of Markov models that can be used for experiments and as derivations for new simulation models. The book details how these analyses are conducted, while providing hands-on instruction on how to develop reliability models for the full range of system configurations. Computer-Aided Rate Modeling and Simulation (CARMS) software is an integrated modeling tool that includes a diagram-based environment for model setup, a spreadsheet like interface for data entry, an expert system link for automatic model construction, and an interactive graphic interface for displaying simulation results.". |
530 ## - ADDITIONAL PHYSICAL FORM AVAILABLE NOTE | |
Additional physical form available note | Also available in print. |
538 ## - SYSTEM DETAILS NOTE | |
System details note | Mode of access: World Wide Web |
588 ## - SOURCE OF DESCRIPTION NOTE | |
Source of description note | Description based on PDF viewed 12/21/2015. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Computer engineering. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name entry element | Reliability (Engineering) |
General subdivision | Mathematical models. |
655 #0 - INDEX TERM--GENRE/FORM | |
Genre/form data or focus term | Electronic books. |
695 ## - | |
-- | Accuracy |
695 ## - | |
-- | Aerospace electronics |
695 ## - | |
-- | Aircraft |
695 ## - | |
-- | Aircraft navigation |
695 ## - | |
-- | Analytical models |
695 ## - | |
-- | Approximation methods |
695 ## - | |
-- | Assembly |
695 ## - | |
-- | Availability |
695 ## - | |
-- | Bibliographies |
695 ## - | |
-- | Biographies |
695 ## - | |
-- | Biological system modeling |
695 ## - | |
-- | Calculus |
695 ## - | |
-- | Central Processing Unit |
695 ## - | |
-- | Circuit faults |
695 ## - | |
-- | Complexity theory |
695 ## - | |
-- | Computational modeling |
695 ## - | |
-- | Convolution |
695 ## - | |
-- | Data models |
695 ## - | |
-- | Databases |
695 ## - | |
-- | Distribution functions |
695 ## - | |
-- | Doppler radar |
695 ## - | |
-- | Equations |
695 ## - | |
-- | Error analysis |
695 ## - | |
-- | Expert systems |
695 ## - | |
-- | Fault detection |
695 ## - | |
-- | Fault tolerance |
695 ## - | |
-- | Fault tolerant systems |
695 ## - | |
-- | Fault trees |
695 ## - | |
-- | Hardware |
695 ## - | |
-- | Indexes |
695 ## - | |
-- | Injuries |
695 ## - | |
-- | Integrated circuit modeling |
695 ## - | |
-- | Load modeling |
695 ## - | |
-- | Loading |
695 ## - | |
-- | Logistics |
695 ## - | |
-- | Maintenance engineering |
695 ## - | |
-- | Markov processes |
695 ## - | |
-- | Mathematical model |
695 ## - | |
-- | Mice |
695 ## - | |
-- | Noise |
695 ## - | |
-- | Numerical models |
695 ## - | |
-- | Operating systems |
695 ## - | |
-- | Positron emission tomography |
695 ## - | |
-- | Pressing |
695 ## - | |
-- | Probabilistic logic |
695 ## - | |
-- | Probability |
695 ## - | |
-- | Random variables |
695 ## - | |
-- | Read only memory |
695 ## - | |
-- | Redundancy |
695 ## - | |
-- | Reliability |
695 ## - | |
-- | Reliability engineering |
695 ## - | |
-- | Safety |
695 ## - | |
-- | Silicon |
695 ## - | |
-- | Software |
695 ## - | |
-- | Software reliability |
695 ## - | |
-- | Solid modeling |
695 ## - | |
-- | Steady-state |
695 ## - | |
-- | System analysis and design |
695 ## - | |
-- | System performance |
695 ## - | |
-- | Terminology |
695 ## - | |
-- | Testing |
695 ## - | |
-- | Tires |
695 ## - | |
-- | Vectors |
695 ## - | |
-- | Weapons |
695 ## - | |
-- | Weibull distribution |
700 1# - ADDED ENTRY--PERSONAL NAME | |
Personal name | Pukite, Paul. |
710 2# - ADDED ENTRY--CORPORATE NAME | |
Corporate name or jurisdiction name as entry element | John Wiley & Sons, |
Relator term | publisher. |
710 2# - ADDED ENTRY--CORPORATE NAME | |
Corporate name or jurisdiction name as entry element | IEEE Xplore (Online service), |
Relator term | distributor. |
776 08 - ADDITIONAL PHYSICAL FORM ENTRY | |
Relationship information | Print version: |
International Standard Book Number | 9780780334823 |
830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE | |
Uniform title | IEEE Press series on engineering of complex computer systems ; |
Volume/sequential designation | 2 |
856 42 - ELECTRONIC LOCATION AND ACCESS | |
Materials specified | Abstract with links to resource |
Uniform Resource Identifier | <a href="https://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263338">https://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263338</a> |
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